Total Dose and Single Event Effect Characterization of ECL Devices

Surinder Seehra,Audrey J. Ditzler,Stephen K. Moyer

Total Dose and Single Event Effect Characterization of ECL Devices

2008

Surinder Seehra
Audrey J. Ditzler
Stephen K. Moyer

Radiation and SEE susceptibility of ECL devices manufactured by ON-semiconductor was studied. Test data shows that these devices are highly susceptible to single event transients and upsets when bombarded with heavy ions.

Keywords:

Test data
Engineering
Electrical engineering
Radiation
Analytical chemistry
Ion
Electronic engineering
Emitter-coupled logic
Temperature measurement
single event effect
Aluminium
total dose

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