Method for X ray detection adopting multi-element exposure parameter formula

The invention discloses a method for testing X-rays through adopting multi-element exposing parameter formulas. Needing darkness can be obtained through adjusting an X-ray machine voltage, and thereby the X- ray can be exposed rapidly and accurately. The invention comprises firstly, taking at least two work pieces whose thickness are T1 and T2 respectively, meanwhile, T1is not equal to T2, secondly, setting corresponding transillumination current as I1, setting exposing time as t1, setting focal length as f1, and setting tube voltage as V2 for the x-ray machine respectively according to the two work pieces, thirdly, aligning the X-ray machine to the central portions of the work pieces according to two groups of parameters, the central portions of the work pieces are illuminated by main X-ray respectively, corresponding negative films with thickness of T1and T2 respectively which are produced through transillumination with the central portions of the work pieces, testing the darkness with a density meter, and recording darkness values as D1and D2 respectively, taking actual measured darkness D1 and D2 into the formula to calculate corresponding voltage V1'value and V2'value without changing other conditions, fourthly, implanting the formula into a controlling chip of a controlling box in the X-ray machine, and automatic explosion can be finished by the X-ray machine.