Programme and Abstracts. Workshop on Expert Evaluation and Control of Compound Semiconductor Materials and Technologies (1st) Held in Ecole Centrale De Lyon, France on 19 -22 May 1992. (EXAMTEC' 92)

Abstract : This workshop included the following topics: Performance and reliability of micro-optoelectronic devices in connection with material properties and process conditions. Material Related Issues and Their Characterization in View of III-V Heterojunction Device Optimization; Material Problems for the Development of InGaAs/InA1As HEMTs Technology; Theoretical and Experimental Study of Failure Mechanisms in RF Reliability Life Tested HEMTs; A Study of Detrimental Transient Effects in GaAs HEMTs; Relating Micron Wave Mapped Data to Physical Parameters for MODFETs; Performance and reliability of micro-optoelectronic devices in connection with material properties and process conditions; Material Related Reliability Aspects of III-V Optical Devices; A possible Origin of Degradation Mechanisms in A1GaAs/GaAs Laser-Like Structures; Thermal Stability of Pseudomorphic HEMT's; Detailed Process Analysis for Controlling the Yield of GaAs MMIC's Technology; Spatially Resolved Photoluminescence Techniques Applied to the Control of InGaAsP/InP Laser Processing; Growth and characterization of epitaxial structures; Atomic Ordering and Phase Separations in Compound Semiconductors and their Effect on Device Behavior; Improved Device Quality by Strained Layer Epitaxy; II-VI Semiconductor Strained Heterostructures: A Structural Review; and Interface Properties of Strained InGaAs/InP Quantum Wells Grown by LP-MOVPE.