Extraordinary Hall effect based magnetic logic applications

Extraordinary Hall Effect (EHE) based original concepts of a reconfigurable logic gate and a multi-bit logic comparator are presented. They exploit the EHE voltage that develops on cross cells connected in series that has no size limitation down to the nanometer scale. Experimental demonstrations are performed on both micro- and nanometer lateral size crosses made of ferrimagnetic TbCo alloy. The simplicity of the device architecture and its robustness make it advantageous when compared with existing systems.