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In-situ Characterization of MoS2 Based Field Effect Transistors During Ion Irradiation
In-situ Characterization of MoS2 Based Field Effect Transistors During Ion Irradiation
2020
Gregor Hlawacek
Zahra Fekri
Panish Chava
Artur Erbe
Keywords:
Optoelectronics
In situ
Ion
Irradiation
Field-effect transistor
Materials science
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