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Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe
Spatially Resolved Detection of Point Defects in the Vicinity of Scratches on GaAs by the Bonn Positron Microprobe
2004
T. E. M. Staab
Christiane Zamponi
M. Haaks
I. Müller
S. Eichler
K. Maier
Keywords:
Crystallographic defect
Microprobe
Analytical chemistry
Materials science
Positron
Optics
spatially resolved
Correction
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