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Optical metrology of nano-scale mineral dissolutions using a phase-shift interference microscope
Optical metrology of nano-scale mineral dissolutions using a phase-shift interference microscope
2005
H. Satoh
Yoshihiro Nishimura
K Tsukamoto
A. Ueda
S. Ueta
Koichi Kato
Keywords:
Interference microscopy
Optoelectronics
optical metrology
Phase (waves)
Materials science
Nanoscopic scale
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