Formalisme rationnel le la méthode de détermination des contraintes résiduelles par diffraction des rayons X: application aux couches minces et multicouches

The use of the rational formalism in the residual stress determination method by X-ray diffraction improves the precision and the mathematical elegance of this method. It eliminates the approximations made in the conventional formalism, and corrects the results by more than 15% in certain case of thin films and multilayers