Fabrication of Multilayered ${\rm MgB}_{2}/{\rm Ni}$ Thin Films and Their Flux Pinning Properties

We prepared the multilayered MgB 2 /Ni thin films with the Ni layer spacings of 32, 23 and 16 nm. The MgB 2 /Ni multilayer nanostructure was confirmed to be obtained from the scanning transmission electron microscope observation. The clear enhancement of J c was observed in the multilayered MgB 2 /Ni thin film when the magnetic field was applied parallel to the film surface. Moreover, the peak position of F p - B curves shifted to higher magnetic field with decreasing the Ni layer spacing.