Simulation and error analysis of electro-optic sampling measurement of ultrashort electron beam bunch length

For the development of high energy physics, it is needed to improve the performance of the relativistic electron bunch. The measurement of the ultrashort relativistic electron pulse becomes one of the key technologies. The electro-optic sampling measurement of relativistic electron pulses is a promising method. This method is nondestructive, non-intrusive, and real-time monitoring. Distance and angles of the reference frames will cause system deviations. In this paper these system deviations are analyzed by simulation. It provides a reference for the experiment.