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Analysis of High-Electric-Field Degradation in AlGaN/GaN HEMTs
Analysis of High-Electric-Field Degradation in AlGaN/GaN HEMTs
2007
Mustapha Faqir
Alessandro Chini
Giovanni Verzellesi
Fausto Fantini
Fabiana Rampazzo
Gaudenzio Meneghesso
E. Zanoni
Peter Kordoš
Keywords:
Optoelectronics
Degradation (geology)
Electric field
Materials science
algan gan
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