Metasurfaces characterization by quantitative phase imaging with SID4 wavefront sensor

Quantitative phase imaging (QPI) solutions are developed to characterize metasurfaces through single-shot. SID4 wavefront analyzer based on the quadriwave lateral shearing interferometry, is used to provide the quantitative phase information. The work presents the ability of the wavefront sensor to characterize metasurfaces regardless its natures (effective refractive index or Pancharatnam-Berry phase, namely), or its phase functions. Advanced analyses are also performed on MetaLenses such as wavefront, PSF, MTF, Zernike polynomial analysis.