Alternative edge illumination set-up for single-shot X-ray phase contrast imaging

Edge illumination (EI) is a promising X-ray phase contrast imaging (XPCI) technique and is expected to translate XPCI into practical applications with laboratory X-ray sources. However, traditional double-mask EI setup requires two acquisitions for extracting phase and absorption information. Although the latest single-mask EI setup allows phase retrieval with single-shot, it requires a nearly ideal detector point spread function (PSF). In this paper, an alternative EI setup is proposed, which remains double-mask but requires only a single-shot. It can implement single-shot XPCI and relax the detector requirements. Numerical calculations are carried out to compare the characteristics of the double- and single-mask EI setup and the proposed setup. The performance of this setup with different illumination conditions is evaluated theoretically. The results suggest that the proposed setup is less affected by the detector PSF compared to the single-mask EI setup and therefore has higher contrast and contrast-t...