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Perturbative phenomena affecting the quality of local measurements of electrical quantities at nanoscale
Perturbative phenomena affecting the quality of local measurements of electrical quantities at nanoscale
2014
B. Gautier
M. Iazykov
A. Grandfond
S. Martin
N. Baboux
L. Militaru
D. Albertini
Keywords:
Electronic engineering
Conductive atomic force microscopy
Nanoscopic scale
Physics
Perturbation theory (quantum mechanics)
Nanotechnology
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