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Validation of electron temperature profiles on W7-X as measured using a x-ray imaging crystal spectrometer
Validation of electron temperature profiles on W7-X as measured using a x-ray imaging crystal spectrometer
2018
N. Pablant
A. Langenberg
A. Alonso
M. Bitter
S. Bozhenkov
R. Burhenn
L. Delgado-Aparicio
G. Fuchert
D. Gates
K W Hill
U. Höfel
M. Hirsch
J. Kring
O. Marchuk
M. Mardenfeld
E. Pasch
A. Pavone
M.L. Reinke
E. Scott
J. Svensson
P. Traverso
G. Weir
T. Wegner
Keywords:
Electron temperature
X-ray
Analytical chemistry
Spectrometer
Chemistry
Materials science
crystal spectrometer
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