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A Plan-view TEM Specimen Preparation Method Using Focused Ion Beam
A Plan-view TEM Specimen Preparation Method Using Focused Ion Beam
2017
Lan-Hsuan Lee
Chia-Hao Yu
Yu Ting-hong
Cheng-Yen Wen
Keywords:
Analytical chemistry
Focused ion beam
Materials science
specimen preparation
Metallurgy
Correction
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