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Performance and reliability of SiGe devices and circuits for high-temperature applications
Performance and reliability of SiGe devices and circuits for high-temperature applications
2009
Dylan B. Thomas
John D. Cressler
Laleh Najafizadeh
S.D. Phillips
R. Wayne Johnson
Leora Peltz
Edward P. Wilcox
Kurt A. Moen
Keywords:
Silicon-germanium
Materials science
Optoelectronics
Electronic circuit
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