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Reliability Design for Neutron Induced Single-Event Burnout of IGBT
Reliability Design for Neutron Induced Single-Event Burnout of IGBT
2011
T. Shoji
Shuichi Nishida
Toyokazu Ohnishi
Touma Fujikawa
Noboru Nose
Kimimori Hamada
Masayasu Ishiko
Keywords:
Engineering
Burnout
Neutron
Insulated-gate bipolar transistor
Electronic engineering
Control engineering
reliability design
Reliability engineering
single event burnout
Electrical engineering
Correction
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