A chip of the chip and test method

Method of the present invention provide a test chip and the chip, the method comprising: transmitting a first test signal of the first means for receiving the transmitted test apparatus, converts it into a second test signal, and the said second test signal to the outside of the chip; the first receiving means for receiving the second test signal, and forwards it to the second transmitting means; the second transmitting means for receiving the second test signal, converting the second signal into a third test the test signal, and sends it to the outside of the chip; the second receiving means receives said third test signal, and returned to the test apparatus; comparing the test device of the third test signal is consistent with the first test signal, if so, the proper chip functionality and performance. Such a test signal forming circuit outside the chip, a test can test the function and performance of the path is correct using a plurality of devices.