A compact flat-crystal X-ray spectrometer for external beam PIXE measurements

A wavelength dispersive system based on a flat crystal coupled to a CCD position-sensitive detector is described. The system, to be used in conjunction with an external beam facility for PIXE measurements, is particularly compact, easy to use, and has a useful energy range extending from about 4 to 13 keV. The performance of the system with respect to efficiency and energy resolution is studied as a function of different experimental conditions. Possible simple applications are briefly discussed.