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The Impact of Polysilicon-Resistor Scaling on the Performance of a VLSI Static RAM Cell
The Impact of Polysilicon-Resistor Scaling on the Performance of a VLSI Static RAM Cell
1981
N.C.C. Lu
Levy Gerzberg
James D. Meindl
Keywords:
Read-write memory
Electronic engineering
Resistor
Very-large-scale integration
Network analysis
Static random-access memory
Voltage
Scaling
Computer science
Electrical engineering
Correction
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