Solution phase driven As2S3 chalcogenide films: Optical and picosecond nonlinear optical properties

We demonstrate the fabrication and nonlinear optical (NLO) characterization of chalcogenide glass thin films obtained from the solution phase driven approach. The characterization of the films was ahieved using FESEM, AFM, micro-Raman, FTIR, UV-Visible spectroscopy, optical profilometry and XRD. The NLO studies were performed on the solution driven and thermally deposited As2S3 films with ∼2ps, 800nm laser pulses using the Z-scan technique. The results obtained from AFM measurements demonstrated that the surface roughness of the film was considerably low (∼2nm) and Z-scan data indicated that the nonlinear refractive index was in the 1.0–11.0×10−18m2/W range.