Jones) in the long wavelength (~10.2µm) from InGaAs/GaAs quantum dot infrared photodetector with quaternary InAlGaAs capping

The Self-assembled InGaAs/GaAs quantum dot infrared detectors (QDIPs) have emerged as a promising technology in many applications such as missile tracking, night vision, medical diagnosis, environmental monitoring etc. On account of the 3-D confinement of carriers in QDs, a number of advantages arise over the QW counterparts. Here we report a quaternary (InAlGaAs) capped In(Ga)As/GaAs QDIP. The samples were grown on a semi-insulating (001) GaAs substrate by solid source molecular beam epitaxy (MBE), and the dots were then capped with a combination of 30A quaternary (In0.21Al0.21Ga0.58As) and 500A of GaAs layer. Both the QD layer and the combination capping were repeated for 35 periods. The device was fabricated by conventional photolithography, ICP etching and metal evaporation technique. XTEM image of the sample depicted nice stacking of defect free quantum dot layers. The dark current is symmetric both for positive and negative bias with a low dark current density of 4.32x10 -6 A/cm 2 at 77K and 1.6 x10