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X-ray powder diffraction and optical characterization of the Cu(In{sub 1-x}Gaâ)âSeâ semiconducting system
X-ray powder diffraction and optical characterization of the Cu(In{sub 1-x}Gaâ)âSeâ semiconducting system
1998
Guy B. Marin
S. Tauleigne
Syed Wasim
R. Gómez Ladrón de Guevara
J.M. Delgado
C. Rincón
Andrés Mora
G. Sánchez Pérez
Keywords:
Materials science
Thin film
Selected area diffraction
Crystallography
Band gap
X-ray crystallography
Electron backscatter diffraction
Solid solution
Powder diffraction
Crystal structure
Correction
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