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Characterization of CIGS Multilayer by Spectroscopic Ellipsometry, from R&D to Production Control
Characterization of CIGS Multilayer by Spectroscopic Ellipsometry, from R&D to Production Control
2008
Alexis Bondaz
Laurent Kitzinger
Christophe Defranoux
Keywords:
Ellipsometry
Copper indium gallium selenide solar cells
Production control
Analytical chemistry
Materials science
spectroscopic ellipsometry
Optoelectronics
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