Diffraction data analysis, microstructure and dielectric studies of transition metal doped LaCoO3

Abstract LaCoO3 based compounds with 5% Cr and Fe ion as impurity at Co site were prepared by standard solid state reaction method. These sample were characterized for structural confirmation via XRD technique and for microstructural and compositional studies through SEM/EDAX characterization. In addition, these materials were investigated for dielectric properties. The X-ray diffraction studies infer that the sample are pure and single phased. These samples have acquired trigonal structure. The XRD result was verified via Rietveld refinement of pristine LaCoO3 compound. FTIR technique has been used to confirm the required oxide formation. The SEM images of these samples reveals that average grain size acquired after sintering is very high however the images present the porosity in the samples. EDAX data study confirmed that all the integral elements of the samples were retained and witnesses the absence of any foreign impurity. Dielectric study of these samples witness the samples exhibit high dielectric constant (capacitance) however the loss values are comparatively high subject to the modifications in microstructure.