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Reference Materials to Enable Precise and Accurate Imaging with Electrical Scanning Probe Microscopes | NIST
Reference Materials to Enable Precise and Accurate Imaging with Electrical Scanning Probe Microscopes | NIST
2017
Joseph J. Kopanski
Lin You
Yaw S. Obeng
Keywords:
Scanning probe microscopy
NIST
Scanning capacitance microscopy
Scanning ion-conductance microscopy
Microscope
Optics
Materials science
Scanning Hall probe microscope
Analytical chemistry
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