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Study of the Electron Tunnelling in Single-Barrier Nanostructures Using the Conductive Atomic Force Microscopy
Study of the Electron Tunnelling in Single-Barrier Nanostructures Using the Conductive Atomic Force Microscopy
2010
Jarosław Gutek
Adam Kosiorek
R. Czajka
Kris Kempa
Michael Giersig
Keywords:
Conductive atomic force microscopy
Nanostructure
Nanotechnology
Analytical chemistry
Electron
Photoconductive atomic force microscopy
Quantum tunnelling
Kelvin probe force microscope
Materials science
Optoelectronics
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