XSW-XAFS characterization of ion-irradiated Pt/Ni/C multilayer

We employ XSW assisted XAFS at Ni K edge to characterize ion-irradiated Pt/Ni/C multilayer, particularly the nanoclusters formed within C layer, revealed by X-TEM and angle-resolved fluorescence studies. Retrieving the structural model from XAFS coordination results involved intriguing steps such as accounting for the intensity variation across the layers, determination of extra pre-diffused Ni into C layer (beyond the reflectivity determined roughness) and decoupling interfacial, layer and cluster coordination. The clusters are determined to be Ni centered Ni-Pt bimetallic nanoclusters (Ni:Pt = 60:40), formed due to irradiation induced diffusion of Pt atoms from the disrupted Pt/C interface towards pre-diffused Ni atoms present in C layer. They are highly disordered beyond nearest neighbor and resemble glassy structure which could find wide-scale applications in magnetic devices.