Investigation of sampling-probe distorted temperature fields with X-ray fluorescence spectroscopy

Abstract Flame-sampling experiments, especially in conjunction with laminar low-pressure premixed flames, are routinely used in combustion chemistry studies to unravel the identities and quantities of key intermediates and their pathways. In many instances, however, an unambiguous interpretation of the experimental and modeling results is hampered by the uncertainties about the probe-induced, perturbed temperature profile. To overcome this limitation, two-dimensional perturbations of the temperature field caused by sampling probes with different geometries have been investigated using synchrotron-based X-ray fluorescence spectroscopy. In these experiments, which were performed at the 7-BM beamline of the Advanced Photon Source (APS) at the Argonne National Laboratory, a continuous beam of hard X-rays at 15 keV was used to excite krypton atoms that were added in a concentration of 5 vol.-% to the unburnt gas mixture and the resulting krypton fluorescence at 12.65 keV was subsequently collected. The highly spatially resolved signal was converted into the local flame temperature to obtain temperature fields at various burner-probe separations as functions of the distance to the burner surface and the radial distance from the centerline. Multiple measurements were performed with different probe geometries and because of the observed impact on the temperature profiles the results clearly revealed the need to specify the sampling probe design to enable quantitative and meaningful comparisons of modeling results with flame-sampled mole fraction data.