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Characterization of an Amorphous Ge_x Si_1-x O_yMicrobolometer for Thermal Imaging Applications
Characterization of an Amorphous Ge_x Si_1-x O_yMicrobolometer for Thermal Imaging Applications
2005
A. H. Z. Ahmed
R. N. Tait
Keywords:
Materials science
Analytical chemistry
Thermal
Amorphous solid
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