Image-quality evaluation and model selection with maximum a posteriori probability
2021
Abstract The maximum a posteriori (MAP) probability rule for atom column detection can also be used as a tool to evaluate the relation between scanning transmission electron microscopy (STEM) image quality and atom detectability. In this chapter, a new image-quality measure is proposed that correlates well with atom detectability, namely the integrated contrast-to-noise ratio (ICNR). Furthermore, the working principle of the MAP probability rule is described in detail showing a close relation to the principles of model-selection methods.
- Correction
- Source
- Cite
- Save
- Machine Reading By IdeaReader
30
References
0
Citations
NaN
KQI