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X-ray phase plate to characterize the polarisation of an helical undulator source at 2.8 keV
X-ray phase plate to characterize the polarisation of an helical undulator source at 2.8 keV
1996
C. Malgrange
J. Goulon
C. Giles
C. Neumann
A. Rogalev
E. Moguiline
F. de Bergevin
Keywords:
Chemistry
Crystallography
Undulator
X-ray
Nuclear magnetic resonance
Polarization (waves)
Optics
phase plate
Correction
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