Old Web
English
Sign In
Acemap
>
Paper
>
Cross-layer reliability modeling and optimization for embedded systems under process variations
Cross-layer reliability modeling and optimization for embedded systems under process variations
2013
Madeleine Faugere
Nikolay Stoimenov
Lothar Thiele
Marc Gatti
James H. Anderson
Claire Pagetti
Pierre Bieber
Virginie Wiels
Keywords:
Theoretical computer science
Parallel computing
Computer science
multicore systems
cross layer
Correction
Source
Cite
Save
Machine Reading By IdeaReader
10
References
0
Citations
NaN
KQI
[]