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Probing Defects in MoS 2 Van der Waals Crystal through Deep‐Level Transient Spectroscopy
Probing Defects in MoS 2 Van der Waals Crystal through Deep‐Level Transient Spectroscopy
2020
Ł. Gelczuk
J. Kopaczek
P. Scharoch
Katarzyna Komorowska
Mark Blei
Sefaattin Tongay
Robert Kudrawiec
Keywords:
van der Waals force
Materials science
Deep-level transient spectroscopy
Molecular physics
Correction
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