EELS Measurements and Ab-initio Calculations of the N–K Edge in TiN/VN Films Deposited on MgO Substrates

1. Erich Schmid Institute of Materials Science, Austrian Academy of Sciences, Jahnstr. 12, A-8700 Leoben, Austria 2. Department for Nanostrucured Materials, Jozef Stefan Institute, Jamova 39, SI-1000 Ljubljana, Slovenia 3. Research Institute for Electron Microscopy, Steyrergasse 17, A-8010 Graz, Austria 4. Department of Physical Metallurgy & Materials Testing, University of Leoben, Franz-Josef-Str. 18, A-8700 Leoben, Austria 5. Institute of General Physics, Vienna University of Technology, Getreidemarkt 9, A-1000 Vienna, Austria 6. Department of Physical Chemistry, University of Vienna, Sensengasse 8, A-1000 Vienna, Austria 7. Department of Chemistry and Biochemistry, Ludwig-Maximilians-University Butenandtstr. 5-13, D-81377 Munich, Germany 8. Department of Materials Physics, University of Leoben, Jahnstr. 12, A-8700 Leoben, Austria