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Machine learning for defect detection for PBFAm using high resolution layerwise imaging coupled with post-build CT scans
Machine learning for defect detection for PBFAm using high resolution layerwise imaging coupled with post-build CT scans
2020
Jan Petrich
Christian Gobert
Shashi Phoha
Abdalla R. Nassar
Edward W. Reutzel
Keywords:
high resolution
Artificial intelligence
Computer vision
Computer science
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