language-icon Old Web
English
Sign In
Acemap > Field > partial scan

partial scan

[ "Automatic test pattern generation", "Scan chain", "Sequential logic", "logic testing", "Fault coverage" ]
Parent Topic
Child Topic
    No Parent Topic
logo
  • CCF Conference Analysis
  • Map Galaxy
  • What's New
© Copyright 2015-2020 Acemap, Inc. Shanghai Jiao Tong University.