Mercury probe

The mercury probe is an electrical probing device to make rapid, non-destructive contact to a sample for electrical characterization. Its primary application is semiconductor measurements where otherwise time-consuming metallizations or photolithographic processing are required to make contact to a sample. These processing steps usually take hours and have to be avoided where possible to reduce device processing times. The mercury probe is an electrical probing device to make rapid, non-destructive contact to a sample for electrical characterization. Its primary application is semiconductor measurements where otherwise time-consuming metallizations or photolithographic processing are required to make contact to a sample. These processing steps usually take hours and have to be avoided where possible to reduce device processing times. The mercury probe applies mercury contacts of well-defined areas to a flat sample. The nature of the mercury-sample contacts and the instrumentation connected to the mercury probe define the application. If the mercury-sample contact is ohmic (non-rectifying) then current-voltage instrumentation can be used to measure resistance, leakage currents, or current-voltage characteristics. Resistance can be measured on bulk samples or on thin films. The thin films can be composed of any material that does not react with mercury. Metals, semiconductors, oxides, and chemical coatings have all been measured successfully.