Satoshi Okutani

Toshiba (Japan)

Author Statistics

Papers

Citation

H-Index

i-10 index

Research Trends

Author Order

Document Type

Co-Authors

Tadashi Akahane

Nagaoka University

M. Kimura

Hokkaido University

Hirokazu Toriumi

The University of Tokyo

Toshiyasu Tadokoro

Synergy University

Ken‐ichi Akao

Fujita Health University

Nobuki Ibaraki

National Institute of Advanced Industrial Science and Technology

Hiroshi Sano

Shiga University

Michiya Kobayashi

Kochi Medical School Hospital

Tatsuro Arayama

NEC (Japan)

Koji Asakawa

Kyoto Institute of Technology

Cooperative Institutions

Toshiba (Japan)

Nagaoka University of Technology

Osaka University

Nagaoka University

The University of Tokyo

Toshiba (South Korea)

Hokkaido University

University of Miyazaki

Advanced Materials and Devices (United States)

Tokyo Institute of Technology

Author Statistics

Papers

Citation

H-Index

i-10 index

Research Field

Dynamics of Surface-Stabilized Ferroelectric Liquid Crystals at the Alignment Layer Surface Studied by Total-Reflection Ellipsometry

Japanese Journal of Applied Physics (2001)

Toshiyasu Tadokoro Ken‐ichi Akao Toshiaki Yoshihara Satoshi Okutani M. Kimura

The reorientation dynamics of surface-stabilized ferroelectric liquid crystals (SSFLCs) at the substrate surface have been studied by time-resolved spectroellipsometry (TRSE). The results of total-reflection TRSE indicate that the surface motion of SSFLC molecules is hindered by a strong anchoring system. The observed dependence of the ellipsometric parameter Ψ on the orienting layer material is discussed in terms of the competitive effects of the surface tilt angle and the strength of the surface anchoring effect. It is also demonstrated that TRSE can analyze the mode of motion of SSFLC molecules in three-dimensional space and can therefore characterize the hysteresis properties of the SSFLC cell in terms of its structural changes.

Anchoring

Ellipsometry

Reflection

Hysteresis

Dynamics

10.1143/jjap.40.l453

Cite

Citations (7)

Investigation of Interfacial Liquid Crystal Orientation by Reflection Ellipsometry

Molecular crystals and liquid crystals science technology. Section A, Molecular crystals and liquid crystals/Molecular crystals and liquid crystals science and technology. Section A, Molecular crystals and liquid crystals (1999)

Satoshi Okutani M. Kimura Tadashi Akahane Hirokazu Toriumi Toshiyasu Tadokoro

Abstract The optical techniques, the Brewster angle reflection method, the dye doped reflection ellipsometry and the total reflection ellipsometry, are proposed to investigate the interfacial Liquid Crystal (LC) director orientation. These methods are based on the analysis of the optical polarization of the reflected light from LC cells. From the experimental and theoretical results, it was found that these methods are useful to study the interfacial LC director orientation. Comparison of these methods with one another clarifies the features and the advantages of each one.

Ellipsometry

Brewster's angle

Reflection

Light reflection

10.1080/10587259908025948

Cite

Citations (2)

Improvement of the light extraction efficiency of top-emitting organic light-emitting diodes by a two-dimensional diffraction layer fabricated using self-assembled nanoparticles

Applied Optics (2009)

Tsutomu Nakanishi Toshiro Hiraoka Akira Fujimoto Shigeru Matake Satoshi Okutani

The light extraction efficiency of top-emitting organic light-emitting diodes (OLEDs) was improved by insertion of a two-dimensional (2D) diffraction layer. The 2D diffraction layer was fabricated by our original nanofabrication technique, the embedded particle monolayer method, which could form a self-assembled particle monolayer. As a result, the electroluminescence intensity of the device with the 2D diffraction layer was improved by 1.67 times (in total luminous flux) and 2.07 times (in peak wavelength). High luminance top-emitting OLEDs were fabricated using the potentially low-cost self-assembling technique.

Diffraction efficiency

10.1364/ao.48.005889

Cite

Citations (8)

Dynamics of Surface-Stabilized Ferroelectric Liquid Crystals at the Alignment Layer Surface Studied by Total-Reflection Ellipsometry : Structure and Mechanical and Thermal Properties of Condensed Matter

Japanese Journal of Applied Physics (2001)

Toshiyasu Tadokoro Ken‐ichi Akao Toshiaki Yoshihara Satoshi Okutani M. Kimura

Ellipsometry

Dynamics

Reflection

Surface layer

Source

Cite

Citations (0)

36.3: An Organic Light-Emitting Diode with Highly Efficient Light Extraction Using Newly Developed Diffraction Layer

SID Symposium Digest of Technical Papers (2008)

Hiroshi Sano Satoshi Okutani Norihiko Kamiura Takumi Sawatani Daisuke Fujita

Abstract In order to improve light extraction from an organic light emitting diode (OLED), a novel structure of a top emission OLED was proposed by applying the diffraction layer. We have achieved 1.65 times higher light extraction efficiency in case of electroluminescence (EL), and 2.37 times in case of photoluminescence (PL).

10.1889/1.3069714

Cite

Citations (1)

Quantitative Analysis of Nematic Director Reorientation Dynamics Studied by Time-Resolved Spectroscopic Ellipsometry

Japanese Journal of Applied Physics (2003)

Toshiyasu Tadokoro Hirokazu Toriumi Satoshi Okutani M. Kimura Tadashi Akahane

The director reorientation dynamics of the nematic liquid crystal (NLC) filled in a conventional sandwich cell was demonstrated by means of time-resolved spectroscopic ellipsometry (TRSE). By using a dye-doped NLC, the transient behavior of the NLC director near the alignment layer as well as that in the bulk can be observed clearly without using any special cavity such as a waveguide. It is shown that the observed transient change of the ellipsometric angles, which corresponds to the director reorientation dynamics, can be completely reproduced by the numerical simulation based on the Frank's elastic continuum theory. From these numerical and experimental results, it is emphasized that TRSE is a potential instrument to analyze the director reorientation dynamics of NLC.

Ellipsometry

Transient (computer programming)

Dynamics

10.1143/jjap.42.4552

Cite

Citations (15)

Determination of the Birefringence, the Twist Angle and the Thickness of the Nematic Liquid Crystal Sample by Renormalized Transmission Ellipsometry

M. Kimura Satoshi Okutani T. Churiki Tadashi Akahane Hirokazu Toriumi

Abstract The birefringence, the twist angle and the thickness of the nematic liquid crystal sample were determined by means of the renormalized transmission ellipsometry. It was proposed that conventional sandwich-type cell is applicable to this ellipsometry measurement and the simplified numerical fitting procedure based on the 4 × 4 matrix method can provide the dispersion of the ordinary and the extraordinary refractive indices. The resolution of the twist angle and cell thickness measurement reaches to 0.05 deg. and 0.05 μm, respectively.

Ellipsometry

Matrix (chemical analysis)

10.1080/10587250108028689

Cite

Citations (6)

Observation of Nematic Liquid Crystal Director Reorientation at the Interface between Substrate and Liquid Crystal Layer by Total Reflection Ellipsometry

Japanese Journal of Applied Physics (2001)

Satoshi Okutani M. Kimura Hirokazu Toriumi Ken‐ichi Akao Toshiyasu Tadokoro

The liquid crystal (LC) director reorientation near the interface between the substrate and the LC layer was studied using total reflection ellipsometry (TRE). The dynamic and static responses of the ellipsometric angles to the electric field were measured by TRE. It was experimentally confirmed that total reflection occurs in the LC cell. The reflected light is dominantly modified by the interfacial LC director reorientation. The polar anchoring strength of the cell was estimated by analyzing the electrical response of the phase difference response. We confirm that the TRE is useful for studying the LC director reorientation near the interface between the substrate and the LC layer.

Ellipsometry

Reflection

Anchoring

10.1143/jjap.40.244

Cite

Citations (29)

Quantitative evaluation of display characteristics of AMOLED displays

Journal of the Society for Information Display (2006)

Satoshi Okutani Michiya Kobayashi Nobuki Ibaraki

10.1889/1.2408395

Cite

Citations (17)