T. Teng

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John K. McRaney

California Department of Parks and Recreation

Chua Thin Wei

Egill Hauksson

California Institute of Technology

L. Hsu

C. G. Sammis

University of British Columbia

Chih‐Hung Pai

Nanya Technology (Taiwan)

Yong‐Ming Tien

National Central University

Foo Loke Sheng

Y. Chen

Thomas L. Henyey

University of Southern California

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University of Southern California

Lamont-Doherty Earth Observatory

Southern California Earthquake Center

California Department of Parks and Recreation

California Department of Transportation

California State University, Northridge

Los Angeles Unified School District

Geological Survey of Denmark and Greenland

Helmholtz Centre Potsdam - GFZ German Research Centre for Geosciences

Karlsruhe Institute of Technology

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Recovered Scan Failure Investigation and Failure Mechanism Determination

Foo Loke Sheng Chua Thin Wei T. Teng Liew Chik Hooi

The success of the electrical fault isolation will assist in narrowing down to the most possible fault location with confidence, and thus increase the success rate in determining the failure mechanism during physical failure analysis. However, any form of recovery from the failure could result in inability to determine the root cause. For example, they are either the sample unable to send to FA since the device is passing, or unable to continue the fault isolation since recovery occurred during analysis. This technical paper will discuss on the investigation of recovery symptom in scan related failure for 55nm wafer technology devices. Through study and investigation, recovery avoidance is implemented during testing, and a new stress flow is identified to reactivate the failure mode. Thus, recoverable failure mechanism like passivation crack and metal defects are identified. The learning from the recovery characteristics also help to forecast possible failure mechanism based on the scan diagnostics and electrical fault isolation findings.

Failure mechanism

Failure causes

Isolation

Catastrophic failure

Passivation

10.1109/ipfa58228.2023.10249095

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A Study on Near-Fault Mortality from the 1999 Chi-Chi, Taiwan Earthquake

AGUFM (2004)

Chih‐Hung Pai Yong‐Ming Tien T. Teng

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