Shih-Chun Lin

National Taiwan University

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S. Mourad

Santa Clara University

S. Krishnan

Sunrise University

C. C. Yang

University of Science and Technology of China

Tzi‐Dar Chiueh

National Taiwan University

Jiun‐Haw Lee

National Taiwan University

B.E. Bentley

Kung‐Jen Ma

Chung Hua University

G.W. Zlotnick

Yen-Chen Lu

National Taiwan University

Shao-Cheng Fang

National Taiwan University

Cooperative Institutions

National Taiwan University

Institute of Electronics

National Dong Hwa University

Yuan Ze University

National Chi Nan University

National Yang Ming Chiao Tung University

National United University

Computational Physics (United States)

National Taiwan University of Science and Technology

National Chung Cheng University

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Performance analysis of impulse radio under timing jitter using m-ary bipolar pulse waveform and position modulation

IEEE Conference on Ultra Wideband Systems and Technologies (2004)

Shih-Chun Lin Tzi‐Dar Chiueh

In this paper, we derive analytical bit error rate (BER) performance of impulse radio using spread-spectrum technique under correlated random timing jitters. The result is applied to the bipolar pulse waveform and position modulation (BPWPM) to study its degradation in performance. High-order derivatives of the Gaussian pulse with about 500 ps pulse width are chosen to comply the FCC part 15 limit. The analysis concludes that both jitter root-mean square (RMS) value and correlation between jitters are important factors that influence system performance. When the jitters are highly correlated, different signal sets will have different levels of performance degradation even with the same jitter RMS value, which needs be taken into consideration in impulse radio system design.

Pulse-position modulation

Root mean square

Impulse Radio

Impulse response

10.1109/uwbst.2003.1267815

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Citations (10)

New bipolar host materials for high power efficiency green thermally activated delayed fluorescence OLEDs

Chemical Engineering Journal (2022)

Chia‐Hsun Chen Shih-Chun Lin Bo‐Yen Lin Che‐Yu Li Yu-Cheng Kong

Quantum Efficiency

Benzonitrile

Intersystem crossing

Ambipolar diffusion

Acceptor

Carbazole

10.1016/j.cej.2022.136292

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Citations (19)

Dependencies of optical and material properties on nominal indium content and well width in InGaN/GaN quantum well structures

Tsung-Yi Tang Chih-Chung Teng Shih-Chun Lin En-Chiang Lin Meng‐Ku Chen

Optical properties and material microstructures of InGaN/GaN quantum wells structures with various nominal indium contents, quantum well widths, and different thermal annealing conditions were compared to show the effects of indium aggregations and strains.

10.1109/cleopr.2003.1277164

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Citations (0)

A self-binning BIST structure for data communications transceivers

IEEE Transactions on Instrumentation and Measurement (2003)

Shih-Chun Lin S. Krishnan S. Mourad

Data communication chips are becoming ubiquitous, and their operating frequencies are constantly increasing. Testing of these devices using customary methods has become increasingly challenging and difficult. An on-chip built-in self-testing (BIST) approach that overcomes such difficulties is proposed in this paper to test the functionality of transceivers on a data communications chip. The proposed BIST is capable of performing functional testing at different speeds, thus facilitating binning of the devices according to their working speeds. The concept has been applied to test a 400 Mbps three-port IEEE 1394a system, implemented in a 0.35 /spl mu/m CMOS technology.

Transceiver

Built-in self-test

Port (circuit theory)

10.1109/tim.2003.818549

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Citations (0)

Carrier relaxation in InGaN∕GaN quantum wells with nanometer-scale cluster structures

Applied Physics Letters (2004)

Hsiang‐Chen Wang Shih-Chun Lin Yen-Chen Lu Yung‐Chen Cheng C. C. Yang

Temperature-dependent femtosecond pump–probe experiments are performed to explore the ultrafast carrier-relaxation processes in an InGaN∕GaN quantum-well sample, in which nanometer-scale cluster structures have been identified. Combined with the time-resolved photoluminescence results, we can identify three stages of carrier relaxation. The fast-decay time, ranging from several hundred femtoseconds to 1 picosecond, corresponds to the process reaching a local quasi-equilibrium condition, in which carriers reach a thermal distribution within one or a few nearby indium-rich clusters. The slow-decay time, ranging from tens to a couple hundred picoseconds, corresponds to the process reaching a global quasi-equilibrium condition, in which carriers reach a thermal distribution among different clusters of various potential minima. In this stage, the mechanism of carrier transport over barriers between clusters dominates the relaxation process. Finally, carrier recombination dominates the relaxation process with the carrier lifetime in the range of a few nanoseconds.

Picosecond

Carrier lifetime

Nanosecond

10.1063/1.1784033

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Citations (20)

NMR structure of LP2086-B01

Alessandro Mascioni B.E. Bentley R. Camarda D.A. Dilts P. Fink

10.2210/pdb2kdy/pdb

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Citations (0)

Design of a low-complexity receiver for impulse-radio ultra-wideband communication systems

Chia‐Hsiang Yang Yu-Hsuan Lin Shih-Chun Lin Tzi‐Dar Chiueh

In this paper, we propose a low-complexity impulse-radio ultra-wideband (UWB) receiver architecture for short-range communication. Algorithms for pulse position and symbol boundary detection, data despreading and decision as well as timing error tracking are embedded in this receiver. Since hardware simplicity is the main consideration of this design, circuit design issues are taken into account early in the design cycle. Simulation results show that the low-complexity architecture works very well in realistic multipath fading channels.

Wideband

Impulse Radio

Rake receiver

Pulse-position modulation

10.1109/iscas.2004.1328956

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Citations (5)

On-Chip Rise-Time Measurement

IEEE Transactions on Instrumentation and Measurement (2004)

Shih-Chun Lin S. Mourad

The on-chip rise-time measurement method for an exponentially decaying signal is proposed. By employing a differentiator, the method circumvents the challenges associated with directly measuring a signal's rise time. The method can be used as the on-chip test instrument as part of a built-in self-testing (BIST) framework, or independently. CMOS circuits and layouts for implementation of the proposed method on a 0.25-/spl mu/m technology have been developed.

Differentiator

Built-in self-test

SIGNAL (programming language)

10.1109/tim.2004.834060

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Citations (5)

Cognitive radio in slow fading channels with partial channel state information at the transmitter

Pin-Hsun Lin Chung-Pi Lee Shih-Chun Lin Hsuan-Jung Su

Cognitive radio (CR) has been proposed as an efficient method to reuse the licensed spectrum. It recognizes the primary (licensed) users' signals and adapts its own to minimize the interference it generates. When perfect channel state information is known at the transmitters, the capacity of CR system can be achieved by utilizing the dirty paper coding (DPC). In this paper, we consider the performance of the CR system under slow fading channels with only channel statistics known at the transmitters. Due to the limited channel state information, the original DPC fails and is replaced by the so-called linear-assignment Gel'fand-Pinsker coding. By carefully designing the parameters based on this precoding, this system has significant rate gains over naively treating primary users' signals as interference for slow fading scenarios. A nested-lattice based coding/decoding scheme is also proposed to implement this precoding in practice, and it validates our theoretical claims.

Channel state information

Dirty paper coding

10.1109/ciss.2008.4558524

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Citations (4)

A BIST methodology for at-speed testing of data communications transceivers

Shih-Chun Lin S. Mourad S. Krishnan

This paper discusses a new BIST methodology suitable for functional testing of transceivers on a data communications chip. Practical circuits are presented which allow the at-speed resting of various functional blocks. The concept has been applied to test a 400 Mbps 3-port IEEE 1394a system. The silicon for the 0.35 /spl mu/m CMOS implementation is expected in early 2001.

Transceiver

Built-in self-test

Port (circuit theory)

10.1109/ats.2000.893628

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Citations (2)