Wang Qing

China Southern Power Grid (China)

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Jinhua Zuo

Beijing Academy of Agricultural and Forestry Sciences

Shichun Yang

Beihang University

Xia Nengqiao

Academia Sinica

Yin Yan-xue

Qufu Normal University

Yong He

Nanjing University of Science and Technology

Jiao Yadong

Anhui University

Liu Yong-ping

Anhui Xinhua University

Guo Li-jiao

Qufu Normal University

Zhishan Gao

Nanjing University of Science and Technology

Qi Cui

Tianjin Chengjian University

Cooperative Institutions

Nanjing University of Science and Technology

Beihang University

Chinese Academy of Sciences

Academia Sinica

Tsinghua University

Qufu Normal University

Anhui University

Peking University

Beijing Academy of Agricultural and Forestry Sciences

Zhejiang University

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Compensation method"of generator jump quantity based on spectral analyzation

Relay (2001)

Wang Qing

Based on spectral analyzation,this paper modifies error of synchronous generator's model.Accuracy of modification Euler is improved greatly and it also avoids mathematical oscillation.This can be used mostly in generator jump quantity's simulation of transient caused by fault or switch operation.At same time,this compensation method based on spectral analyzation can also be used in other transient simulation of power system.

Transient (computer programming)

Oscillation (cell signaling)

Euler method

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Intelligent design of the micro electronic piezo gauge FDYQ-II

Sensor World (2012)

Wang Qing

Due to the gap between FDYQ-Ⅱ microelectronic piezo gauge and the similar products in the world markets on intelligent level and convenience of use, some optimization designs are made from the hardware and software on intelligent communication and operation, which come from software mainly compared to original design. Software designs mainly include the design of the working status, microcontroller software and host computer software, and the hardware modifi cation analysis of the front panel design are given. Intelligent design improves the ease of operation greatly and adds a few auxiliary functions, as well as improves the stability and reliability of the test.

Microelectronics

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