D. E. Steinhauer

Massachusetts General Hospital

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Steven M. Anlage

University of Maryland, College Park

F. C. Wellstood

University of Maryland, College Park

C. P. Vlahacos

University of Maryland, College Park

B. J. Feenstra

Philips (Netherlands)

S. K. Dutta

Tata Institute of Fundamental Research

Ashfaq S. Thanawalla

University of Maryland, College Park

H. S. Newman

United States Naval Research Laboratory

Wensheng Hu

Institute of Electronics

Sudeep Dutta

Georgetown University

Jon Hayenga

Phoenix Contact (United States)

Cooperative Institutions

University of Maryland, College Park

Phoenix Contact (United States)

University of California, Berkeley

Lawrence Berkeley National Laboratory

University of Washington

Massachusetts General Hospital

Joint Quantum Institute

Georgetown University

Physical Sciences (United States)

Control Vision (United States)

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Near-field scanning microwave microscopy: measuring local microwave properties and electric field distributions

B. J. Feenstra C. P. Vlahacos Ashfaq S. Thanawalla D. E. Steinhauer S. K. Dutta

We describe the near-field scanning microwave microscopy of microwave devices on a length scale much smaller than the wavelength used for imaging. Our microscope can be operated in two possible configurations, allowing a quantitative study of either material properties or local electric fields.

Microwave Imaging

Scanning Probe Microscopy

10.1109/mwsym.1998.705152

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Magnetic permeability imaging of metals with a scanning near-field microwave microscope

Applied Physics Letters (2000)

Sheng-Chiang Lee C. P. Vlahacos B. J. Feenstra A. Schwartz D. E. Steinhauer

We describe a scanning near-field microwave microscope which uses a loop probe to measure local magnetic properties of metallic samples on a length scale of 200 μm. We demonstrate imaging at 6 GHz through spatiallyresolved ferromagnetic resonance experiments on a single crystal of the colossal magneto-resistive material La0.8Sr0.2MnO3. We find the experimental results are qualitatively and quantitatively well described by a simple model of the system.

Microwave Imaging

Resistive touchscreen

10.1063/1.1332978

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Microwave Frequency Ferroelectric Domain Imaging of Deuterated Triglycine Sulfate Crystals

APS (2001)

D. E. Steinhauer Steven M. Anlage

We have used a near-field scanning microwave microscope to image domain structure and quantitatively measure dielectric permittivity and nonlinearity in ferroelectric crystals at 8.1 GHz with a spatial resolution of 1 μm. We imaged ferroelectric domains in periodically poled LiNbO3, BaTiO3, and deuterated triglycine sulfate (DTGS) with a signal-to-noise ratio of 7. Measurement of the permittivity and nonlinearity of DTGS in the temperature range 300–400 K shows a peak at the Curie temperature, TC≈340 K, as well as reasonable agreement with thermodynamic theory. In addition, the domain growth relaxation time shows a minimum near TC. We observe coarsening of ferroelectric domains in DTGS after a temperature quench from 360 to 330 K and evaluate the structure factor.

Triglycine sulfate

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Near-Field Microwave Microscopy of Materials Properties

arXiv (Cornell University) (2000)

Steven M. Anlage D. E. Steinhauer B. J. Feenstra C. P. Vlahacos F. C. Wellstood

Near-field microwave microscopy has created the opportunity for a new class of electrodynamics experiments of materials. Freed from the constraints of traditional microwave optics, experiments can be carried out at high spatial resolution over a broad frequency range. In addition, the measurements can be done quantitatively so that images of microwave materials properties can be created. We review the five major types of near-field microwave microscopes and discuss our own form of microscopy in detail. Quantitative images of microwave sheet resistance, dielectric constant, and dielectric tunability are presented and discussed. Future prospects for near-field measurements of microwave electrodynamic properties are also presented.

Microwave Imaging

10.48550/arxiv.cond-mat/0001075

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Microwave near-field imaging of electric fields in a superconducting microstrip resonator

Applied Physics Letters (1998)

Ashfaq S. Thanawalla S. K. Dutta C. P. Vlahacos D. E. Steinhauer B. J. Feenstra

We describe the use of a cryogenic near-field scanning microwave microscope to image microwave electric fields from superconducting and normal-metal microstrip resonators. The microscope employs an open-ended coaxial probe and operates from 77 to 300 K in the 0.01-20 GHz frequency range with a spatial resolution of about 200 mm. We describe the operation of the system and present microwave images of Cu and Tl2Ba2CaCu2O8 microstrip resonators, showing standing wave patterns at the fundamental and second harmonic frequencies.

Coaxial

Microwave Imaging

10.1063/1.122492

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Near-field scanning microwave microscopy of microwave devices

APS (1997)

C. P. Vlahacos D. E. Steinhauer S. K. Dutta Steven M. Anlage F. C. Wellstood

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Surface resistance imaging with a scanning near-field microwave microscope

Applied Physics Letters (1997)

D. E. Steinhauer C. P. Vlahacos S. K. Dutta F. C. Wellstood Steven M. Anlage

We describe near-field imaging of sample sheet resistance via frequency shifts in a resonant coaxial scanning microwave microscope. The frequency shifts are related to local sample properties, such as surface resistance and dielectric constant. We use a feedback circuit to track a given resonant frequency, allowing measurements with a sensitivity to frequency shifts as small as two parts in 106 for a 30 ms sampling time. The frequency shifts can be converted to sheet resistance based on a simple model of the system.

Coaxial

Scanning Probe Microscopy

10.1063/1.120020

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Quantitative Topographic Imaging using a Near-field Scanning Microwave Microscope

APS (1998)

C. P. Vlahacos D. E. Steinhauer S. K. Dutta B. J. Feenstra Steven M. Anlage

We describe a technique for extracting topographic information using a scanning near-field microwave microscope. By monitoring the shift of the system’s resonant frequency, we obtain quantitative topographic images of uniformly conducting metal surfaces. At a frequency of 9.572 GHz, our technique allows a height discrimination of about 55 nm at a separation of 30 μm. We present topographic images of uneven, conducting samples and compare the height response and sensitivity of the system with theoretical expectations.

Microwave Imaging

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Theory and operation of a near-field scanning microwave microscope

APS March Meeting Abstracts (1997)

C. P. Vlahacos D. E. Steinhauer S. K. Dutta Steven M. Anlage F. C. Wellstood

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Quantitative Imaging of Microwave Permittivity, Tunability, Polarization, and Domain Structure in Ferroelectrics

APS March Meeting Abstracts (2000)

D. E. Steinhauer

Microwave Imaging

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