M. Salomo

University of Kaiserslautern

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E. Oesterschulze

University of Kaiserslautern

Martin Aeschlimann

University of Kaiserslautern

Günther Wittstock

Carl von Ossietzky Universität Oldenburg

Sascha E. Pust

Forschungszentrum Jülich

J. Wüsten

University of Kaiserslautern

A. Mönnich

University of Kaiserslautern

Michael Bauer

Kiel University

Christiane Ziegler

University of Kaiserslautern

Benjamin Schaaf

RWTH Aachen University

Stefan Lach

Rheinland-Pfälzische Technische Universität Kaiserslautern-Landau

Cooperative Institutions

University of Kaiserslautern

Rheinland-Pfälzische Technische Universität Kaiserslautern-Landau

Paul Scherrer Institute

Uppsala University

Kiel University

Carl von Ossietzky Universität Oldenburg

Robert Bosch (Germany)

Centre National de la Recherche Scientifique

Institut d'électronique de microélectronique et de nanotechnologie

Daimler (Germany)

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Fabrication and characterization of coaxial scanning near-field optical microscopy cantilever sensors

Microelectronic Engineering (2009)

M. Salomo Daniela Bayer Benjamin Schaaf Martin Aeschlimann E. Oesterschulze

Coaxial

Characterization

Scanning Probe Microscopy

10.1016/j.mee.2009.11.031

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Citations (4)

Integrated cantilever probes for SECM/AFM characterization of surfaces

Microelectronic Engineering (2009)

M. Salomo Sascha E. Pust Günther Wittstock E. Oesterschulze

Scanning Electrochemical Microscopy

Characterization

Micrometer

Scanning Probe Microscopy

10.1016/j.mee.2009.11.032

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Citations (30)

Influence of electrode size and geometry on electrochemical experiments with combined SECM–SFM probes

Nanotechnology (2010)

Sascha E. Pust M. Salomo E. Oesterschulze Günther Wittstock

Gold electrodes integrated into silicon scanning force microscopy (SFM) probes allow the acquisition of spatially correlated data for sample morphology (via SFM) and local electrochemical reactivity via scanning electrochemical microscopy (SECM). The lateral resolution of both techniques is controlled by different properties of the integrated probes. The topographic tracking provided by the SFM mechanism allows the realization of very small working distances for the SECM measurements. Microfabrication technology was used in order to reduce the size of the active electrode area of the tip into the sub-100 nm regime. The functionality of the probes was tested using electrochemical methods. Experiments revealed that the response could be quantitatively compared to numerical simulation. The low working distance, in combination with the small size of the active electrode area, allows for high lateral resolution in the SECM images. This is illustrated with different model substrates that cover a range of different rate constants and illustrate the dependence of the SECM contrast on the local kinetics of the sample in the sub-micrometre size range.

Scanning Electrochemical Microscopy

Scanning Probe Microscopy

10.1088/0957-4484/21/10/105709

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Citations (36)

Hot-electron dynamics in thin films of sodium-doped perylene-3,4,9,10-tetracarboxylic dianhydride

Physical Review B (2008)

J. Wüsten Steffen Berger M. Salomo A. Mönnich Michael Bauer

Time-resolved two-photon photoemission of the doping process of perylene-tetracarboxylicdianhydride (PTCDA) thin films with sodium gives insight into the dynamics of hot electrons in this system. Interaction with Na results in a charge transfer from Na to PTCDA and increases the lifetime of optically excited electrons. A similar increase in lifetime can be observed for ultrathin PTCDA layers on Ag(111). Both results are discussed in the one-electron picture, treated in ``classical'' photoemission theory, and in the many-electron picture as commonly considered for strongly correlated systems.

10.1103/physrevb.78.195326

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Citations (7)