Frank Seiboth

Deutsches Elektronen-Synchrotron DESY

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Christian G. Schroer

Deutsches Elektronen-Synchrotron DESY

Andreas Schropp

Deutsches Elektronen-Synchrotron DESY

Gerald Falkenberg

Deutsches Elektronen-Synchrotron DESY

Jan Garrevoet

Deutsches Elektronen-Synchrotron DESY

Bob Nagler

SLAC National Accelerator Laboratory

Eric Galtier

SLAC National Accelerator Laboratory

Hae Ja Lee

SLAC National Accelerator Laboratory

Jens Patommel

TU Dresden

Robert Hoppe

University of Twente

Martin Seyrich

Deutsches Elektronen-Synchrotron DESY

Cooperative Institutions

SLAC National Accelerator Laboratory

115

Deutsches Elektronen-Synchrotron DESY

Menlo School

Stanford University

European X-Ray Free-Electron Laser

Linac Coherent Light Source

Universität Hamburg

Paul Scherrer Institute

Lawrence Livermore National Laboratory

Technical University of Denmark

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Pump-probe X-ray holographic imaging of laser-induced cavitation bubbles with femtosecond FEL pulses

Nature Communications (2021)

Malte Vassholz Hannes Hoeppe J. Hagemann Juan Manuel Rosselló Markus Osterhoff

Abstract Cavitation bubbles can be seeded from a plasma following optical breakdown, by focusing an intense laser in water. The fast dynamics are associated with extreme states of gas and liquid, especially in the nascent state. This offers a unique setting to probe water and water vapor far-from equilibrium. However, current optical techniques cannot quantify these early states due to contrast and resolution limitations. X-ray holography with single X-ray free-electron laser pulses has now enabled a quasi-instantaneous high resolution structural probe with contrast proportional to the electron density of the object. In this work, we demonstrate cone-beam holographic flash imaging of laser-induced cavitation bubbles in water with nanofocused X-ray free-electron laser pulses. We quantify the spatial and temporal pressure distribution of the shockwave surrounding the expanding cavitation bubble at time delays shortly after seeding and compare the results to numerical simulations.

Temporal resolution

10.1038/s41467-021-23664-1

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Density measurements of dynamically-compressed, melting phase silicon via simultaneous in-situ x-ray diffraction and x-ray contrast imaging using the LCLS x-ray free electron laser at MEC

Bulletin of the American Physical Society (2016)

Shaughnessy Brown Hae Ja Lee Bob Nagler Eric Galtier Zhou Xing

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Ronchi test for characterization of X-ray nanofocusing optics and beamlines

Journal of Synchrotron Radiation (2014)

Fredrik Uhlén Jussi Rahomäki Daniel Nilsson Frank Seiboth Claude Sanz

A Ronchi interferometer for hard X-rays is reported in order to characterize the performance of the nanofocusing optics as well as the beamline stability. Characteristic interference fringes yield qualitative data on present aberrations in the optics. Moreover, the visibility of the fringes on the detector gives information on the degree of spatial coherence in the beamline. This enables the possibility to detect sources of instabilities in the beamline like vibrations of components or temperature drift. Examples are shown for two different nanofocusing hard X-ray optics: a compound refractive lens and a zone plate.

X-ray optics

Advanced Photon Source

Degree of coherence

Characterization

10.1107/s160057751401323x

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Hard X-ray wavefront correction via refractive phase plates made by additive and subtractive fabrication techniques

Journal of Synchrotron Radiation (2020)

Frank Seiboth Dennis Brückner Maik Kahnt Mikhail Lyubomirskiy Felix Wittwer

Modern subtractive and additive manufacturing techniques present new avenues for X-ray optics with complex shapes and patterns. Refractive phase plates acting as glasses for X-ray optics have been fabricated, and spherical aberration in refractive X-ray lenses made from beryllium has been successfully corrected. A diamond phase plate made by femtosecond laser ablation was found to improve the Strehl ratio of a lens stack with a numerical aperture (NA) of 0.88 × 10 −3 at 8.2 keV from 0.1 to 0.7. A polymer phase plate made by additive printing achieved an increase in the Strehl ratio of a lens stack at 35 keV with NA of 0.18 × 10 −3 from 0.15 to 0.89, demonstrating diffraction-limited nanofocusing at high X-ray energies.

Subtractive color

10.1107/s1600577520007900

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Ptychographical imaging of the phase vortices in the x-ray beam formed by nanofocusing lenses

Journal of Physics Conference Series (2014)

Dmitry Dzhigaev Ulf Lorenz Ruslan P. Kurta Frank Seiboth Tomaš Stankevič

We present the ptychography reconstruction of the x-ray beam formed by nanofocusing lenses (NFLs) containing a number of phase singularities (vortices) in the vicinity of the focal plane. As a test object Siemens star pattern was used with the finest features of 50 nm for ptychography measurements. The extended ptychography iterative engine (ePIE) algorithm was applied to retrieve both complex illumination and object functions from the set of diffraction patterns. The reconstruction revealed the focus size of 91.4$\pm$1.1 nm in horizontal and 70$\pm$0.3 nm in vertical direction at full width at half maximum (FWHM). The complex probe function was propagated along the optical axis of the beam revealing the evolution of the phase singularities.

Ptychography

Optical vortex

10.1088/1742-6596/499/1/012020

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CRL optics and silicon drift detector for P06 Microprobe experiments at 35 keV

Powder Diffraction (2020)

Gerald Falkenberg Frank Seiboth Frieder Koch Ken Vidar Falch Andreas Schropp

A provisional setup for X-ray microprobe experiments at 35 keV is described. It is based on compound refractive lenses (CRLs) for nanofocusing and a Vortex silicon drift detector with 2 mm sensor thickness for increased sensitivity at high energies. The Microprobe experiment (PETRA III) generally uses Kirkpatrick-Baez mirrors for submicrometer focusing in the energy range of 5–21 keV. However, various types of scanning X-ray microscopy experiments require higher excitation energies. The CRL optics were characterized by X-ray ptychography and X-ray fluorescence (XRF) knife edge scans on a siemens star pattern and showed beam sizes down to 110 nm. The performance of the new setup for microscopic X-ray diffraction (XRD)–XRF scanning X-ray microscopy measurements at 35 keV is demonstrated on a cross-section of a painting fragment.

Microprobe

Microbeam

10.1017/s0885715620000536

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Design, fabrication, and testing of diamond axicons for X-ray microscopy applications

arXiv (Cornell University) (2024)

Nazanin Samadi Frank Seiboth Carlos Sato Baraldi Dias Dmitri Novikov Kathryn M. Spiers

This work presents the design, fabrication, and experimental validation of a refractive diamond axicon for X-ray beam shaping. The diamond axicon was developed to overcome the limitations of polymer-based axicons particularly for application in Transmission X-ray Microscopy (TXM) systems, offering superior mechanical strength, thermal stability, and radiation resistance, making it ideal for synchrotron applications. The axicon was fabricated using femtosecond laser ablation and tested at 11 keV under various coherence conditions. Results demonstrated that the axicon efficiently transformed the X-ray beam into a ring-shaped profile with over 80% transmission. Simulations confirmed the experimental findings and highlighted the potential for further improvements. This work paves the way for the use of diamond axicons in next-generation synchrotron facilities, with future efforts focusing on optimizing fabrication and testing the axicon in full TXM systems.

10.48550/arxiv.2410.01327

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Hard x-ray nanoprobe of beamline P06 at PETRA III

AIP conference proceedings (2016)

Christian G. Schroer Christoph Baumbach Ralph Döhrmann Susanne Klare Robert Hoppe

The hard x-ray scanning microscope at beamline P06 of PETRA III at DESY in Hamburg serves a large user community, from physics, chemistry, and nanotechnology to the bio-medical, materials, environmental, and geosciences. It has been in user operation since 2012, and is mainly based on nanofocusing refractive x-ray lenses. Using refractive optics, nearly gaussian-limited nanobeams in the range from 50 to 100 nm can be generated in the hard x-ray energy range from 8 to 30 keV. The degree of coherence can be traded off against the flux in the nanobeam by a two-stage focusing scheme. We give a brief overview on published results from this instrument and describe its most important components and parameters.

DESY

X-ray optics

10.1063/1.4952830

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Citations (13)

Scanning coherent x-ray microscopy as a tool for XFEL nanobeam characterization

Andreas Schropp Robert Hoppe Jens Patommel Frank Seiboth Fredrik Uhlén

Characterization

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The dynamic response of high pressure phase of Si using phase contrast imaging and X-ray diffraction