Main text In 2009, the Consultative Committee for Ionizing Radiation (CCRI) approved its first supplementary comparison, to be organized by the ENEA (as the pilot laboratory), for the measurement of the alpha and beta particle surface (i.e. 2 solid angle) emission rate from large area sources of the type used for calibrating surface contamination monitors. Five sources were disseminated to the twenty-three participating laboratories consisting of one each of 241Am, 14C, 147Pm and 90Sr for emission rate measurements, with one additional 90Sr source for the evaluation of source uniformity. Measurements of the radionuclide activity and radionuclidic purity were also made although not strictly required. This report describes the organization of this comparison and the material and measurement methods used. The proposed supplementary comparison reference values (SCRV) for each of the comparison measurands are given, together with the Degrees of Equivalence and their associated uncertainties for each participating laboratory. The results of this supplementary comparison may be used as evidence by participating National Metrology Institutes (NMIs) and Designated Institutes (DIs) when submitting calibration and measurement capabilities (CMCs) for the given radionuclides for similar types of large area sources; this is an important aspect of this comparison, given that only one other international supplementary comparison for surface emission rates had been organized before. To reach the main text of this paper, click on Final Report . Note that this text is that which appears in Appendix B of the BIPM key comparison database https://www.bipm.org/kcdb/ . The final report has been peer-reviewed and approved for publication by the CCRI, according to the provisions of the CIPM Mutual Recognition Arrangement (CIPM MRA).
Alpha probes, consisting of a ZnS(Ag) scintillator and a photo-multiplier tube, are commonly used throughout the nuclear industry for radiation protection and clearance of materials during decommissioning. The success in achieving these purposes is dependent on a number of factors including the counting efficiency of the probe, the condition of the material being monitored, the speed of monitoring and the distance between the probe and material. The efficiency of the probe is dependent on the operating voltage and is the only factor that is under the control of the calibration facility. As the calibration laboratory may not be aware of the specific environment in which the probe will be used, an operating voltage to suite a wide range of conditions must be chosen. In the past, it has frequently been assumed that it is necessary to set as high an operating voltage as possible in order to maximise the counting efficiency to low-energy alpha particles. However, the response to gamma rays, particularly those having low energies, also increases with operating voltage and will therefore limit the upper operating voltage that can be set. The efficiency of a scintillation-type probe (NE Technology AP2) in measuring contamination levels on a number of typical surfaces using different operating voltages has been investigated. It has been found that the surface characteristics of the material being monitored have far more effect on the results of alpha monitoring than the choice of operating voltage. Thus the calibration laboratory can set the operating voltage below the level at which there is a risk of response to low-energy gamma rays without significantly affecting the overall counting efficiency for low-energy alpha particles.
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