Emrah Yücelen

Microsoft (United States)

Author Statistics

Papers

Citation

H-Index

i-10 index

Research Trends

Author Order

Document Type

Co-Authors

Rafal E. Dunin‐Borkowski

Ernst Ruska Centre

Amir H. Tavabi

Ernst Ruska Centre

Eric Bosch

Missouri State University

Stefano Frabboni

University of Modena and Reggio Emilia

Ivan Lazić

Thermo Fisher Scientific (Netherlands)

Kongyi Li

Microsoft (United States)

Andrey E. Antipov

Microsoft (United States)

Tomaš Stankevič

Microsoft (United States)

Jonne Koski

Microsoft (United States)

Dominik Vogel

Harz University of Applied Sciences

Cooperative Institutions

Microsoft (United States)

187

Delft University of Technology

Quantum Group (United States)

University of Copenhagen

QuTech

University of California, Santa Barbara

Forschungszentrum Jülich

Thermo Fisher Scientific (Netherlands)

Microsoft (Denmark)

Purdue University West Lafayette

Author Statistics

Papers

Citation

H-Index

i-10 index

Research Field

Soft Matter X-ray Microanalysis in the Analytical Electron Microscope

Microscopy and Microanalysis (2018)

Mikhail Ovsyanko Emrah Yücelen Evgeniya Pechnikova M. Falke Qian Chen

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Microanalysis

10.1017/s1431927618004373

Cite

Citations (3)

Quantitative atomic 3-D imaging of single/double sheet graphene structure

Carbon (2010)

Joerg R. Jinschek Emrah Yücelen H.A. Calderón Bert Freitag

Carbon fibers

Acceleration voltage

10.1016/j.carbon.2010.09.058

Cite

Citations (58)

Experimental realization of the Ehrenberg-Siday thought experiment

Applied Physics Letters (2016)

Giulio Pozzi Chris Boothroyd Amir H. Tavabi Emrah Yücelen Rafal E. Dunin‐Borkowski

In 1949, at the end of a paper dedicated to the concept of the refractive index in electron optics, Ehrenberg and Siday noted that wave-optical effects will arise from an isolated magnetic field even when the rays themselves travel in magnetic-field-free space. They proposed a two-slit experiment, in which a magnetic flux is enclosed between interfering electron beams. Now, through access to modern nanotechnology tools, we used a focused ion beam to open two nanosized slits in a gold-coated silicon nitride membrane and focused electron beam induced deposition to fabricate a thin magnetic bar between the two slits. We then performed Fraunhofer experiments in a transmission electron microscope equipped with a field emission gun and a Lorentz lens. By tilting the specimen in the objective lens field of the electron microscope, the magnetization of the bar could be reversed and the corresponding change in the phase of the electron wave observed directly in the form of a shift in the interference fringe pattern.

Field emission gun

Electron optics

Electron holography

10.1063/1.4942462

Cite

Citations (7)

Quantitative Phase Imaging of Ba 2 NaNb 5 O 15

Microscopy and Microanalysis (2016)

Emrah Yücelen Ivan Lazić Eric Bosch

Journal Article Quantitative Phase Imaging of Ba 2 NaNb 5 O 15 Get access Emrah Yucelen, Emrah Yucelen FEI Electron Optics B.V., Achtseweg Noord 5, 5651 GG, Eindhoven, The Netherlands Search for other works by this author on: Oxford Academic Google Scholar Ivan Lazic, Ivan Lazic FEI Electron Optics B.V., Achtseweg Noord 5, 5651 GG, Eindhoven, The Netherlands Search for other works by this author on: Oxford Academic Google Scholar Eric Bosch Eric Bosch FEI Electron Optics B.V., Achtseweg Noord 5, 5651 GG, Eindhoven, The Netherlands Search for other works by this author on: Oxford Academic Google Scholar Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 1458–1459, https://doi.org/10.1017/S1431927616008138 Published: 25 July 2016

Electron probe microanalysis

10.1017/s1431927616008138

Cite

Citations (1)

Comparative characterization of selective-area growth and vapourliquid- solid III-V semiconductor-superconductor nanowire networks for topological quantum computing

Marc Botifoll Sara Martı́-Sánchez Emrah Yücelen Philippe Caroff Jordi Arbiol

Resumen del poster presentado al Microscopy at the Frontiers of Science Congress Series (MFS), celebrado en el Parque de las Ciencias de Granada (Espana) del 11 al 13 de septiembre de 2019.

Characterization

Source

Cite

Citations (0)

2D Atomic Mapping of Oxidation States in Transition Metal Oxides by Scanning Transmission Electron Microscopy and Electron Energy-Loss Spectroscopy

Physical Review Letters (2011)

Haiyan Tan Stuart Turner Emrah Yücelen Johan Verbeeck Gustaaf Van Tendeloo

Using a combination of high-angle annular dark-field scanning transmission electron microscopy and atomically resolved electron energy-loss spectroscopy in an aberration-corrected transmission electron microscope we demonstrate the possibility of 2D atom by atom valence mapping in the mixed valence compound ${\mathrm{Mn}}_{3}{\mathrm{O}}_{4}$. The Mn ${L}_{2,3}$ energy-loss near-edge structures from ${\mathrm{Mn}}^{2+}$ and ${\mathrm{Mn}}^{3+}$ cation sites are similar to those of MnO and ${\mathrm{Mn}}_{2}{\mathrm{O}}_{3}$ references. Comparison with simulations shows that even though a local interpretation is valid here, intermixing of the inelastic signal plays a significant role. This type of experiment should be applicable to challenging topics in materials science, such as the investigation of charge ordering or single atom column oxidation states in, e.g., dislocations.

Valence electron

X-Ray Spectroscopy

10.1103/physrevlett.107.107602

Cite

Citations (136)

Controllable Atomic Scale Patterning of Freestanding Monolayer Graphene at Elevated Temperature

ACS Nano (2013)

Qiang Xu Mengyue Wu Grégory F. Schneider Lothar Houben Sairam K. Malladi

We show that by operating a scanning transmission electron microscope (STEM) with a 0.1 nm 300 kV electron beam, one can sculpt free-standing monolayer graphene with close-to-atomic precision at 600 °C. The same electron beam that is used for destructive sculpting can be used to image the sculpted monolayer graphene nondestructively. For imaging, a scanning dwell time is used that is about 1000 times shorter than for the sculpting. This approach allows for instantaneous switching between sculpting and imaging and thus fine-tuning the shape of the sculpted lattice. Furthermore, the sculpting process can be automated using a script. In this way, free-standing monolayer graphene can be controllably sculpted into patterns that are predefined in position, size, and orientation while maintaining defect-free crystallinity of the adjacent lattice. The sculpting and imaging processes can be fully computer-controlled to fabricate complex assemblies of ribbons or other shapes.

Dwell time

Atomic units

10.1021/nn3053582

Cite

Citations (113)

Liftout of High-Quality Thin Sections of a Perovskite Oxide Thin Film Using a Xenon Plasma Focused Ion Beam Microscope

Microscopy and Microanalysis (2019)

Ian MacLaren Magnus Nord Chengge Jiao Emrah Yücelen

Abstract It is shown that a xenon plasma focused ion beam (FIB) microscope is an excellent tool for high-quality preparation of functional oxide thin films for atomic resolution electron microscopy. Samples may be prepared rapidly, at least as fast as those prepared using conventional gallium FIB. Moreover, the surface quality after 2 kV final polishing with the Xe beam is exceptional with only about 3 nm of amorphized surface present. The sample quality was of a suitably high quality to allow atomic resolution high-angle annular dark field imaging and integrated differential phase contrast without any further preparation, and the resulting images were good enough for quantitative evaluation of atomic positions to reveal the oxygen octahedral tilt pattern. This suggests that such xenon plasma FIB instruments may find widespread application in transmission electron microscope and scanning transmission electron microscope specimen preparation.

10.1017/s1431927618016239

Cite

Citations (10)

InAs-Al hybrid devices passing the topological gap protocol

Physical review. B./Physical review. B (2023)

Morteza Aghaee Arun Akkala Zulfi Alam Rizwan Ali Alejandro Alcaraz Ramirez

Topological phases of matter can enable highly stable qubits with small footprints, fast gate times, and digital control. These hardware-protected qubits must be fabricated with a material combination in which a topological phase can reliably be induced. The challenge: disorder can destroy the topological phase and obscure its detection. This paper reports on devices with low enough disorder to pass the topological gap protocol, thereby demonstrating gapped topological superconductivity and paving the way for a new stable qubit.

10.1103/physrevb.107.245423

Cite

Citations (123)

Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution

Scientific Reports (2018)

Emrah Yücelen Ivan Lazić Eric Bosch

Using state of the art scanning transmission electron microscopy (STEM) it is nowadays possible to directly image single atomic columns at sub-Å resolution. In standard (high angle) annular dark field STEM ((HA)ADF-STEM), however, light elements are usually invisible when imaged together with heavier elements in one image. Here we demonstrate the capability of the recently introduced Integrated Differential Phase Contrast STEM (iDPC-STEM) technique to image both light and heavy atoms in a thin sample at sub-Å resolution. We use the technique to resolve both the Gallium and Nitrogen dumbbells in a GaN crystal in [[Formula: see text]] orientation, which each have a separation of only 63 pm. Reaching this ultimate resolution even for light elements is possible due to the fact that iDPC-STEM is a direct phase imaging technique that allows fine-tuning the microscope while imaging. Apart from this qualitative imaging result, we also demonstrate a quantitative match of ratios of the measured intensities with theoretical predictions based on simulations.

Dark field microscopy

10.1038/s41598-018-20377-2

Cite

Citations (212)