Elizabeth Diaz-Jacobo

SLAC National Accelerator Laboratory

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Alan Fry

Stanford University

Stefan Droste

Vescent Photonics (United States)

Alexander H. Reid

SLAC National Accelerator Laboratory

S. Zohar

SLAC National Accelerator Laboratory

Ryan Coffee

SLAC National Accelerator Laboratory

Giacomo Coslovich

Linac Coherent Light Source

Michael P. Minitti

Linac Coherent Light Source

Vaughn E. White

SLAC National Accelerator Laboratory

L. Shen

Linac Coherent Light Source

F. Tavella

SLAC National Accelerator Laboratory

Cooperative Institutions

SLAC National Accelerator Laboratory

Linac Coherent Light Source

Stanford University

Menlo School

Fermi National Accelerator Laboratory

Deutsches Elektronen-Synchrotron DESY

Lawrence Livermore National Laboratory

Czech Technical University in Prague

National Institute of Standards and Technology

Max Planck Society

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High-sensitivity X-ray Optical Cross-Correlator for Next Generation Free-Electron Lasers

Conference on Lasers and Electro-Optics (2019)

Stefan Droste L. Shen Vaughn E. White Elizabeth Diaz-Jacobo Ryan Coffee

We designed a novel X-ray arrival time monitor that cross-correlates X-ray and 1550 nm optical pulses used in state-of-the-art femtosecond timing distribution systems. We exploit an interferometric detection scheme and etalon effects in thin-film Germanium to achieve unprecedented high sensitivity to soft X-rays.

10.1364/cleo_si.2019.sf3i.7

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High-sensitivity x-ray/optical cross-correlator for next generation free-electron lasers

Optics Express (2020)

Stefan Droste S. Zohar L. Shen Vaughn E. White Elizabeth Diaz-Jacobo

We design and realize an arrival time diagnostic for ultrashort X-ray pulses achieving unprecedented high sensitivity in the soft X-ray regime via cross-correlation with a ≈1550 nm optical laser. An interferometric detection scheme is combined with a multi-layer sample design to greatly improve the sensitivity of the measurement. We achieve up to 275% of relative signal change when exposed to 1.6 mJ/cm2 of soft X-rays at 530 eV, more than a hundred-fold improvement in sensitivity as compared to previously reported techniques. The resolution of the arrival time measurement is estimated to around 2.8 fs (rms). The demonstrated X-ray arrival time monitor paves the way for sub-10 fs-level timing jitter at high repetition rate X-ray facilities.

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10.1364/oe.398048

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High-Sensitivity X-Ray Optical Cross-Correlator for Next Generation Free-Electron Lasers

Conference on Lasers and Electro-Optics (2019)

Stefan Droste L. Shen Vaughn E. White Elizabeth Diaz-Jacobo Ryan Coffee

Free electron model

10.23919/cleo.2019.8749670

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