O.F.J. Noordman

ASML (Netherlands)

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Beam-propagation method for second-harmonic generation in waveguides with birefringent materials

Journal of the Optical Society of America B (1997)

H.J.W.M. Hoekstra O.F.J. Noordman Gijs Krijnen R. K. Varshney E. Henselmans

Finite difference equations are given for second-harmonic generation in two-dimensional planar structures for coupling between TE polarizations at two frequencies as well as for TM polarizations at two frequencies, including the effect of birefringence in the latter case. Attention is given to obtaining accurate expressions for the finite difference operators for points close to interfaces, and it is shown how the equations for nonlinear coupling can be incorporated into the beam-propagation method and the coupled-mode theory. Computational results of second-harmonic generation incorporating both the coupled mode theory and the beam-propagation method are given and discussed.

Beam propagation method

Harmonic

Coupled mode theory

Mode coupling

Finite difference

10.1364/josab.14.001823

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Citations (14)

Second harmonic generation in organic Cerenkov-type and modematching devices

O.F.J. Noordman Kerstin Wörhoff N.F. van Hulst

Harmonic

Source

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Citations (1)

Second Harmonic Microscopy of self-organising calix[4]arene thin films

O.F.J. Noordman N.F. van Hulst

Source

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Citations (0)

CCDC 109728: Experimental Crystal Structure Determination

The Cambridge Structural Database (1999)

Paul J. A. Kenis O.F.J. Noordman S. Houbrechts G. J. VAN HUMMEL Sybolt Harkema

An entry from the Cambridge Structural Database, the world’s repository for small molecule crystal structures. The entry contains experimental data from a crystal diffraction study. The deposited dataset for this entry is freely available from the CCDC and typically includes 3D coordinates, cell parameters, space group, experimental conditions and quality measures.

Crystal (programming language)

10.5517/cc3p5mk

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Time-resolved hyper-Rayleigh scattering: measuring first hyperpolarizabilities β of fluorescent molecules

Chemical Physics Letters (1996)

O.F.J. Noordman N.F. van Hulst

Hyperpolarizability

10.1016/0009-2614(96)00218-7

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Citations (109)

Second harmonic generation with organic materials

O.F.J. Noordman Kerstin Wörhoff N.F. van Hulst

Source

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Citations (0)

Molecular and macroscopic second order nonlinear optical properties of calix[4]arenes

Polymeric materials science and engineering (1996)

Paul J. A. Kenis O.F.J. Noordman Bianca H. M. Snellink‐Ruël Johan F. J. Engbersen N.F. van Hulst

Calixarene

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Supramolecular Materials: Molecular Packing of Tetranitrotetrapropoxycalix[4]arene in Highly Stable Films with Second-Order Nonlinear Optical Properties

Chemistry - A European Journal (1998)

Paul J. A. Kenis O.F.J. Noordman Holger Schönherr Esther G. Kerver Bianca H. M. Snellink‐Ruël

Crystallization in an electric field leads to highly stable films of tetranitrotetrapropoxycalix[4]arene (shown on the right) with second-order nonlinear optical properties. The ordered noncentrosymmetric packing of the molecules in these films was elucidated by a combination of X-ray diffraction, angle-dependent second-harmonic generation, and atomic force microscopy, and confirmed by solid-state molecular dynamics calculations.

10.1002/(sici)1521-3765(19980710)4:7<1225::aid-chem1225>3.3.co;2-y

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CCDC 109732: Experimental Crystal Structure Determination

The Cambridge Structural Database (1999)

Paul J. A. Kenis O.F.J. Noordman S. Houbrechts G. J. VAN HUMMEL Sybolt Harkema

10.5517/cc3p5rp

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Citations (0)

<title>Operation of a scanning near-field optical microscope in reflection in combination with a scanning force microscope</title>

Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE (1992)

Niko F. van Hulst M.H.P. Moers O.F.J. Noordman Thomas Faulkner F. B. Segerink

Images obtained with a Scanning Near field Optical Microscope (SNOM) operating in reflection are presented.We have obtained the first results with a SiN tip as optical probe.The instrument is simultaneously operated as a Scanning Force Microscope (SFM).Moreover the instrument incorporates an inverted light microscope (LM) for preselection of a scan area.The SiN probe is operated in the contact regime causing a highly improved lateral resolution in the optical image compared to an alternative set-up using a fibre probe, which is also presented.The combined microscope is operated either in open loop or as a force regulated SNOM.Near field optical images can be directly compared with the topography displayed in the simultaneously recorded SFM image.

Reflection

10.1117/12.58190

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Citations (35)